PIER Journals
PhotonIcs and Electromagnetics Research Symposium, also known as Progress In Electromagnetics Research Symposium
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SC3: X-ray Computed Tomography and Advance Manufacturing

Session Organizers

Wenjuan Sun
National Physical Laboratory
UK
Yushu Shi
National Institute of Metrology
China

Session Chairs

Wenjuan Sun
National Physical Laboratory
UK

Session Infomation

Advanced manufacturing (AM), led by additive manufacturing, has the capability to produce components with complex geometries compared with conventionally machined parts. There is an increasing demand from manufacturers and end-users for solutions to inspect AM components non-destructively. X-ray computed tomography (XCT) is a technique offering great potential. However, the technology and its application in the industry are still in their infancy. This session aims to present and disseminate the latest developments in XCT for quality control and its industrial impact across a variety of applications. It is also expected to define synergies and collaboration opportunities between different organisations and commercial representatives. The topics include but not limited to: technology advances, instrument calibration, error correction, data reconstruction, industrial applications, etc.

Submitted Articles

Kindly be aware that this is not the final version and the date/time of presentations may be slightly adjusted. The date for each talk will be finalized in Advance Program by 5 October, 2021. The time for each talk will be finalized in Final Program by 20 October, 2021.
Presenting Author Talk Time Paper Title | Authors | Abstract Session Date / Room
16:00
Web
Invited
The Recent Development of X-ray Computed Tomography for Advanced Manufacturing at the National Physical Laboratory
*Wenjuan Sun (National Physical Laboratory)
[View Abstract]
1P2c
2022-04-25
PM
Room: Online ROOM 2
16:15
Web
Invited
Fast Hyperparameter Calibration of Sparsity Enforcing Penalties in Total Generalised Variation Penalised Reconstruction Methods for XCT Using a Planted Virtual Reference Image
*Stephane Chretien (Universite Lyon 2) *** Wenjuan Sun (National Physical Laboratory) Jessica Talbott (National Physical Laboratory)
[View Abstract]
1P2c
2022-04-25
PM
Room: Online ROOM 2
16:30
Web
Invited
Application of Industrial CT Technology in Additive Manufacturing Field
*Zhanping Zuo (YXLON (Beijing) X-ray Equipment Trading Co., Ltd.) ***
[View Abstract] [Published Paper]
1P2c
2022-04-25
PM
Room: Online ROOM 2
16:45
Web
Invited
Surface Texture Traceability for XCT
*Claudiu L. Giusca (Cranfield University)
[View Abstract]
1P2c
2022-04-25
PM
Room: Online ROOM 2
17:00
Onsite
Invited
Metrology Extension for X-ray Microscopy
*Dingzhong Han (Carl Zeiss (Shanghai) Co., Ltd.)
[View Abstract]
1P2c
2022-04-25
PM
Room: Online ROOM 2
17:20
Web
Invited
The Art of the Iterative XCT Image Reconstruction
*Manuchehr Soleimani (University of Bath)
[View Abstract]
1P2c
2022-04-25
PM
Room: Online ROOM 2
17:35
Web
The Application of Watershed Surface Determination Algorithm in X-ray Computed Tomography for Dimensional Metrology
*Xiuyuan Yang (Cranfield University) Wenjuan Sun (National Physical Laboratory) Claudiu L. Giusca (Cranfield University)
[View Abstract]
1P2c
2022-04-25
PM
Room: Online ROOM 2
17:45
Onsite
Design and Application of a Novel X-ray 3D Microscope
*Ying Xu (Sanying Precision Instruments Co., Ltd)
[View Abstract]
1P2c
2022-04-25
PM
Room: Online ROOM 2

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